Path: OKDatasheet > Semiconductor Datasheet > TI Datasheet > SN74BCT8244ADW
SN74BCT8244ADW manual: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS
Path: OKDatasheet > Semiconductor Datasheet > TI Datasheet > SN74BCT8244ADW
SN74BCT8244ADW manual: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS
Manufacturer : TI
Packing : DW
Pins : 24
Temperature : Min 0 °C | Max 70 °C
Size : 322 KB
Application : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS