Path: OKDatasheet > Semiconductor Datasheet > TI Datasheet > SN74BCT8374ADWR
SN74BCT8374ADWR manual: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
Path: OKDatasheet > Semiconductor Datasheet > TI Datasheet > SN74BCT8374ADWR
SN74BCT8374ADWR manual: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
Manufacturer : TI
Packing : DW
Pins : 24
Temperature : Min 0 °C | Max 70 °C
Size : 323 KB
Application : SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS